Hinged QFN8 Test Socket with Insulating Housing and Metal Contacts

This electronic part is a compact test socket designed as a QFN8 test socket for chip handling, inspection, and board-level work. The universal is marked for both QFN8 and DIP8 test socket use, giving it a practical fit for testing or code loading different chip formats. The hinged black flip clamp socket helps hold the chip in place during operation, supporting a more stable connection point setup. Built with a beige insulating housing and metal connection point pins, this test point socket is made for direct electrical connection in a compact rectangular form. Ideal for chip testing and code loading, this test socket provides a focused interface that helps simplify electronic part evaluation and setup.